High-density integration (HDI) technology in PCB manufacturing processes can enable end product designs to be more miniaturized while meeting higher standards of electronic performance and efficiency. HDI technology is currently widely used in mobile phones, digital cameras, notebook computers, automotive electronics and other digital products, among which mobile phones are the most widely used.
The use of laser blind vias as the main micro vias is one of the key technologies of HDI. The characteristics of laser blind holes with small aperture and large number of holes are an effective way to achieve high wiring density of HDI boards. Therefore, the reliability of laser blind holes directly determines the reliability of the product.
Judging from the existing research results in the industry, the reliability of laser blind holes mainly depends on the process flow and dielectric layer materials.
Generally speaking, the main causes of blind via failure include:
(1) Due to the poor bonding force between the blind hole copper and the bottom copper, the blind hole copper and the bottom copper appear to separate during use of the product;
(2) Since the copper of the blind hole foot hole is thin, the copper of the blind hole foot hole breaks during use of the product. This article uses an HDI product laser blind hole failure case with cracks at the bottom as the starting point to discuss the failure mechanism of poor bonding between the blind hole and the bottom copper.